LTBis Laser Diode Life Test and Burn-in System

LTBis Laser Diode Life Test and Burn-in System Fibotec Fiberoptics
 
  • SW11745
Output Current per Channel LD 2 A; Output Current per Channel TEC ±3 A; Benchtop Mount;... more
Product information "LTBis Laser Diode Life Test and Burn-in System"

Output Current per Channel LD 2 A; Output Current per Channel TEC ±3 A; Benchtop Mount; Compatible with Butterfly Lasers; Current Stability 0.5%

Fibotec Fiberoptics’ LTBiS laser diode life test and burn-in system is a multi-channel laser diode drive and TEC temperature control system that can be controlled through a digital electronic interface. The system design is modular, so that up to 10 laser diodes can be controlled independently within one 19-inch instrument. Several instruments operated by one PC can be combined in a rack. A half-width rack that accommodates 4 plug-in units is available as an option.

Applications for the LTBiS are laser diode burn-in and laser diode life test. The LTBiS consists of two hardware parts: The 19-inch mainframe (master) and up to 10 plug-in units (or a 9.5-inch wide master and up to 4 plug-in units). The master can be easily controlled by commands through the serial interface.

The external forward testing photodiode is integrated with the plug-in units and can be connected to the laser by an external fiber loop. Both, photodiode and laser, have a front plate access that is terminated by FC/APC.

Key Features:

  • Backplane: 84 TE (Accepts up to 10 Plug-in Units, 42 HE (Accepts up to 4 Plug-in Units)
  • Iop: max 2 A (LD), max. 3 A (TEC)
  • Max. Compliance Voltage: 2.9 V
  • Operation of LD in ACC, APC Mode, PVI-Test
  • TEC Setpoint: -20°C to +60°C (set LD TEC)
  • Setpoint Resolution: 0.5K (LD TEC), 0.5 mA (Iop), ~1 mW (Ip-out or IMPD), 0.5 mA Min. Current Increment (PVI-Test)
  • Temperature Stability (TEC Setpoint): 0.1K (@Constant TMF After 1 h Warm-up)
  • Current Stability (Iop): 2 mA (@Constant TMF After 1 h Warm-up)
  • Modulation: 20 Hz Minimum, Max. Rise/Fall Time 1 µs
  • Power Stability (IP-out or IMPD): 4 mW (@Constant TMF After 1 h Warm-up)
  • Compliance Voltage Stability: 10 mV (@Constant TMF After 1 h Warm-up)
  • Control Interface: RS-232 (USB Optional)
  • Wavelength Range: 750 nm to 1650 nm for Power Out Test by External PD (IP-out)
  • Fiber Termination: FC/APC for Power Out Test by External PD (IP-out)
  • Fixture Accepts: Butterfly Package Laser Diodes (“Pump LD Pinout”)
  • Dimensions: 19-inch Rack (84 TE), 4 HE, 9.5-inch Rack (42 TE), 4 HE
  • Power Supply: 2 Redundant Power Supplies 110-230 VAC
  • Air Flow for Cooling: Bottom Front Side in, Back Side out
  • Operating Temperature: +5°C to +50°C (Non-condensing)

Applications: Multiple Laser Diode Burn-in; Multiple Laser Diode Life Test

Manufacturer Series Name: LTBis
Product Group: Laser Diode Life Test and Burn-in System
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