mORL-A1/mIL-A2 MAP Benchtop IL and RL Test Solutions

AMS item number: SW10656

2 and 4 wavelengths versions; 850 to 1625 nm; Measurement Time Averaging Options 2, 5, 10 s;... more

Product information "mORL-A1/mIL-A2 MAP Benchtop IL and RL Test Solutions"

2 and 4 wavelengths versions; 850 to 1625 nm; Measurement Time Averaging Options 2, 5, 10 s; Fiber Type Single Mode, Multi Mode; Connectors FC/APC, FC/PC

Viavi Solutions’ mORL-A1/mIL-A2 MAP series provides single mode insertion loss / return loss test meters and fully EF-compliant multi mode insertion loss test modules for use with Viavi Solutions’ advanced MAP-300 (and legacy MAP-200) platforms.

Viavi Solutions’ passive component/connector test solution (PCT) consists of a powerful family of modules, software and peripherals for testing insertion loss, return loss, physical length, and polarity of optical connectivity products. Leveraging the modularity and connectivity of Viavi Solutions’ MAP-300 (and legacy MAP-200) platform, the PCT can be configured for R&D, production, or qualification test environments and can address all key fiber types from single mode through OM1 and OM4.

The mORL-A1/mIL-A2 MAP series is often used in conjunction with the optical switch (mOSW-C1/mISW-C1) and remote optical power meter (mOPM-C1) MAP modules.

In mORL-A1 MAP series single mode IL and RL meters, one single-slot module contains up to four sources (1310, 1490, 1550, 1625 nm), and integrated power meter, and an optional 2x2 optical switch for automated bidirectional testing. mORL-A1 MAP series multi mode IL and RL modules are based on the same basic technology and architecture as the single mode modules described above. A standard dual-wavelength version is available (850, 1300 nm) for multi mode applications with an integrated power meter and optional 2x2 optical switches for automated bidirectional testing. The dual-fiber option can test 50 µm or 62.5 µm from the same module.

The final measurement module in the PCT family is the mIL-A2 MAP multi mode insertion loss meter which is a powerful, stable, and compact IL-only solution. One single-slot module contains two LED sources (850 nm and 1300 nm) and an integrated power meter for manual or automated testing. It is an ideal lower-cost option for applications that do not require RL measurements. Its excellent source stability and launch monitoring minimizes reference frequency requirements.

The MAP-300 (and legacy MAP-200) series is the first photonic layer lab and manufacturing platform to be LAN Extensions for Instrumentation (LXI)-compliant, bringing the full power of Ethernet connectivity and ease of use of interchangeable virtual instrument (IVI) drivers to the optical test environment. The MAP Series platform’s industry-leading density and configurability enables test engineers to meet specific application requirements in the smallest possible footprint.

Key Features:

Increases Production Yield by a Factor of 4
Requires Only 25% of the Space of Other Solutions
Enables Expansion Into New High-growth, High-performance Applications such as 40/100 G Data Center Markets
Modular Platform Can Scale as Needs Arise and Budget Allows
Port Mapping Verifies Multifiber MPO Cassette Continuity and Polarity in Less Than 15 Seconds
Fully Supports High-growth MPO and MTP Multifiber Connectors

Applications: Testing IL/RL/Length of Optical Connectors and Cable Assemblies, Structured Cabling Solutions and Optical Splitters; Automated Test of Multifiber Assemblies such as MPO; Solutions for Both Single Mode and Multi Mode Fiber-based Devices; Verifying Continuity and Polarity of Large Multifiber Assemblies; Measuring RL of Line Cards and Receptacle-based Transponders