PIN-DSS/DSIn Dual Sandwich Detectors

PIN-DSS_DSIn Dual Sandwich Detectors OSI Optoelectronics
  • SW11048
400 to 1800 nm; Active Area 1.77, 5.06 mm2; AA Dia. 1.50, 2.54 mm; Rise Time 4 to 150 µs;... more
Product information "PIN-DSS/DSIn Dual Sandwich Detectors"

400 to 1800 nm; Active Area 1.77, 5.06 mm2; AA Dia. 1.50, 2.54 mm; Rise Time 4 to 150 µs; Responsivity 0.12 to 0.60 A/W; Capacitance 70 to 300 pF; Package TO-5, TO-8

OSI Optoelectronics’ PIN-DSS and PIN-DSIn series of dual sandwich detectors or two-color detectors are mostly employed for remote temperature measurements. The temperature is measured by taking the ratio of radiation intensities of two adjacent wavelengths and comparing them with the standard black body radiation curves.

The advantages of optical remote measurement definitely make these devices the perfect match for this type of measurements. They are independent of emissivity and unaffected by contaminants in the field of view or moving targets. In addition, measurements of targets out of the direct line of sights and the ability to function from outside RF/EMI interference or vacuum areas are possible.

PIN-DSS and PIN-DSIn series devices also have the advantages of overcoming obstructed target views, blockages from sight tubes, channels or screens, atmospheric smoke, steam, or dust, dirty windows as well as targets smaller than field of view and/or moving within the field of view. These detectors can also be used in applications where wide wavelength range of detection is needed.

OSI Optoelectronics offers three types of dual sandwich detectors:

  • The silicon-silicon sandwich version PIN-DSS, in which one silicon photodiode is placed on top of the other, with the photons of shorter wavelengths absorbed in the top silicon and the photons of longer wavelengths penetrating deeper, absorbed by the bottom photodiode.
  • Aimed at applications requiring a wider range of wavelength beyond 1100 nm, in the PIN-DSIn series an InGaAs photodiode replaces the bottom photodiode.
  • The silicon-InGaAs version is also available with a two stage  (PIN-DSIn-TEC) for more accurate measurements by stabilizing the temperature of the InGaAs detector.

All devices are designed for photovoltaic operation (no bias), however, they may be biased if needed, to the maximum reverse voltage specified. They are ideal for coupling to an operational amplifier in the current mode.

Key Features:

  • Si-Si (PIN-DSS) and Si-InGaAs (PIN-DSIn) Sandwich Versions
  • Compact
  • Hermetically Sealed
  • Low Noise
  • Wide Wavelength Range: 400 to 1800 nm
  • Remote Measurements
  • Versions With TEC Available (PIN-DSIn-TEC)

Applications: Flame Temperature Sensing; Spectrophotometers; Dual-wavelength Detection; IR Thermometers for Heat Treating, Induction Heating and Other Metal Parts Processing

Product Group: Dual Sandwich Detectors
Manufacturer Series Name: PIN-DSS/DSIn
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