Other Optical Test and Measurement Equipment available from Stock
Optical technologies are employed in a wide range of test and measurement procedures and equipment. For example, a dedicated sensor uses a laser beam to , thus allowing for continuous monitoring of the condition of machines in scenarios such as Industry 4.0, IIoT and Predictive Maintenance. Starter kits based on this technology are available from AMS Technologies for building contactless vibration measurement solutions as well as .
AMS Technologies broad portfolio of other optical test and measurement equipment ranges from fault locators in optical fibers and fiber components all the way to multi-function analyzers.
Our series of fiber optic fault locators in bench-top, pocket and pen format are launching visible (635 nm) laser diode light into the optical fiber that is scattered by breaks, sharp bend or other faults in fibers as well as connectors – thus allowing to visually locate possible defects by spotting the emerging scattered light.
Optical backscatter reflectometers feature ultra-high resolution with backscatter-level sensitivity to measure distributed return loss (RL) and insertion loss (IL) with high precision and dynamic range and easily locate optical loss events with sub-millimeter resolution. These reflectometers are available as portable and rugged devices for testing short fiber optic networks deployed in aerospace, naval, data center and industrial applications, as well as in a benchtop form factor, designed for component testing, short run network testing and troubleshooting.
With more than 80 dB of reflection dynamic range and down to 10 µm of spatial resolution, our optical coherence domain reflectometer helps engineers and researchers see the inside of an optical device to precisely identify defects and their locations. It is designed to obtain space-resolved reflection information inside a fiber optical component, such as a photonic integrated circuit (PIC), for diagnosing quality or design issues.
Lightwave component analyzers are available from AMS Technologies in two versions: Working in either reflection or transmission, the lightwave component analyzer for maximum device lengths of up to 40 m measures and analyzes the insertion loss (IL) and return loss (RL) distribution as well as length with a single instrument. And our lightwave component analyzers for maximum device lengths of up to 150 m are ideal for production test and quality control while delivering the extremely high resolution and sensitivity that is critical when testing and validating modern photonic devices and network subsystems.
We carry a multi-channel optical component analyzer that simultaneously measures insertion loss (IL), polarization dependent loss (PDL), and optical power (P) on multiple optical paths – expandable to up to 40 channels and an ideal solution for easy, accurate characterization of components and modules with multiple outputs, including DWDMs, ROADMs, AWGs and PLCs.
Capable of full and complete all-parameter linear characterization of single mode optical components in a single scan, our optical vector analyzer is the fastest, most accurate and economical tool for loss, dispersion and polarization measurements of modern optical networking equipment, providing comprehensive component characterization of dispersion compensation modules, AWGs, fiber Bragg gratings and many other optical devices.
Our standalone laser diode analyzer provides quick and versatile laser diode characterization and parametric analysis. The unit features a high-resolution LIV (light, current, voltage) measurement system, providing all main laser diode parameters including threshold current and slope efficiency – in auto-current or auto-power control modes. An integrated TEC controller and exchangeable laser diode holders and adapters allow for analyzing any laser diode package.
Sources & Emulators
Sources/emulators for polarization mode dispersion (PMD) available from AMS Technologies include a flexible, digital PMD source that deterministically generates precise 1st order PMD up to 180 ps and 2nd order PMD up to 8,100 ps, as well as a DGD/PMD source accurately and repeatably generating both high and low values of differential group delay (DGD).
Specially designed for PDL-related (polarization dependent loss) tests of high-speed fiber optic devices, our PDL emulator can generate individual and variable PDL values between 0 and 20 dB, with a resolution of 0.1 dB, user-defined range, waveform, and speed for PDL tolerance, PDL tracking speed and recovery time tests.
Our interferometers are important tools for quality control. We carry interferometers for measuring fiber holders, single- and multi-fiber connectors, but also systems for other applications like a fiber-pigtailed Mach-Zehnder free space interferometer or Michelson and Mach-Zehnder fiber interferometers.
A broad portfolio of further devices for inspection, test and measurement of optical connectors is available like an extensive range of fiber optic microscopes for every application and budget, tools and systems for measuring passive optics and connectors, as well as other fiber properties measurement devices like fiber analysers, tensile testers, or refractive index measurement services.
AMS Technologies’ further optical test and measurement offerings include beam profilers, integrating spheres, reflectance targets, spectrometers, spectrographs and spectroscopy cameras, as well as fiber sensing equipment.
Tools for fiber optics processing, dispensing and curing of optical adhesives and cleaning of optical connector surfaces round off the AMS Technologies range of solutions around optical test, tools and measurement.
Alternative Terms: Fiber Optic Fault Locator; Optical Backscatter Reflectometer; Optical Coherence Domain Reflectometer; Lightwave Component Analyzer; Optical Component Analyzer; Optical Vector Analyzer; Laser Diode Analyzer; PMD Source; PMD Emulator; PDL Emulator