mEDFA-C1 MAP Benchtop EDFA Modules

mEDFA-C1 MAP Bentchtop EDFA Modules Viavi Solutions
 
  • SW10665
Erbium-doped; 1528 to 1610 nm; Input Power -4 to 0 dBm; Output Power ≥20, ≥21, ≥25 dBm... more
Product information "mEDFA-C1 MAP Benchtop EDFA Modules"

Erbium-doped; 1528 to 1610 nm; Input Power -4 to 0 dBm; Output Power ≥20, ≥21, ≥25 dBm

Viavi Solutions’ mEDFA-C1 series of MAP Erbium Doped Fiber Amplifiers meets some of the most demanding optical specifications including a low-noise version with <3.7dB noise figure. DWDM, high power and an L-band version are also available.

mEDFA-C1 MAP is a third-generation amplifier design, optimized for use in the systems lab or for optical test and measurement applications. The simplified control and modular design make the module extremely simple to integrate and use. It removes the need to “work-around” networking management protocols that often frustrate R&D and manufacturing engineers and slow down test automation. The mEDFA-C1 has six carefully selected variants designed to span the most critical application requirements.

While simple to control from the front panel or over the remote interface, the mEDFA-C1 MAP amplifiers meet some of the most demanding optical specifications including a low noise version with <3.7dB noise figure. These low noise amplifiers are essential for test automation implementations where system path loss requires a test signal power boost prior to application to the DUT. In most cases OSNR impairments must be kept to a minimum. Auto gain and power control options are designed to simplify power management, in particular when a single channel tunable source is used. DWDM, High Power and an L-band version are also available.

As part of the MAP-300 family (also compatible with MAP-200), the mEDFA-C1 MAP module series is an Ethernet or GPIB modular instrument that can be directly managed from your PC-based automation system. A member of the LightDirect Family of MAP-300 modules, the mEDFA-C1 can be deployed in the compact MAP-220C 2-slot chassis, the MAP-330 3-slot chassis or the larger MAP-380 8-slot chassis systems. Alongside the many other modules, such as amplifiers, precision attenuators, power meters and spectrum analyzers, MAP-300 is the ideal modular photonics test platform for 100G+ test applications.

Key Features:

  • Variant Options to Cover Low Noise Figure (<3.7 dB) or High Power (>25 dBm) Requirements
  • Single-channel Extended C and L Band Versions
  • Gain Flattened DWDM Multichannel Extended C Band Versions
  • Automated Gain and Power Control Options

Applications: Amplification of Sensitive Signals in Automated Test Systems; Power Saturation Recovery Testing; OSNR Noise Loading

Manufacturer Series Name: mEDFA-C1 MAP
Product Group: Benchtop EDFA Modules
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