Product information "LCA 500 Lightwave Component Analyzers"
1270-1610 nm; Wavelength Resolution 1.6 pm; Loss Measurement Dynamic Range 60, 80 dB; Loss Measurement Resolution ±0.002, ±0.05 dB; Laser Sweep Rate 70 nm/s; Measurement Time 12, 55 s; Maximum Device Length 75, 150 m
Luna’s LCA 500 lightwave component analyzers are fast and accurate systems that are ideal for production test and quality control. The LCA 500 series provides the high throughput and connectivity needed for the manufacturing floor while delivering the extremely high resolution and sensitivity that is critical when testing and validating modern photonic devices and network subsystems.
The LCA 500 lightwave component analyzers provide single-scan measurements for testing a wide range of passive components from couplers to Optical Fibers and everything in between (Fiber Bragg Gratings, arrayed waveguide gratings, free-space filters, tunable devices, amplifiers, etc.).
Single Scan Measurement of Insertion Loss (IL), Return Loss (RL) and Polarization Dependent Loss (PDL)
High Resolution: 1.6 pm
High Sensitivity: 80 dB Dynamic Range
Integrated Tunable Light Source – No External Tunable Laser Needed
Measure in Transmission or Reflection
Compatible With C and L Band (LCA 500) or O Band (LCA 513)
Complete Full-band Measurement Scan in Less Than 3 s
Wavelength Range: 1270 to 1610 nm
Wavelength Resolution: 1.6 pm
Loss Measurement Dynamic Range: 60, 80 dB
Loss Measurement Resolution: ±0.002, ±0.05 dB
Laser Sweep Rate: 70 nm/s, 1 Hz
Measurement Time: 12, 55 s
Maximum Device Length: 75 m (Reflection), 150 m (Transmission)
Applications:Testing of Passive Components like DWDMs, AWGs, Filters, Switches, Waveguide Gratings, Modulators, Couplers, etc.; High-resolution Measurements for Planar Light Circuits (PLCs) and Silicon Photonic Devices; Manufacturing Test and Quality Control; Flexible Tunable Laser Source splitters
Lightwave Component Analyzers
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