Detector Type Si, IR-Enhanced Si, InGaAs, UV-Enhanced InGaAs, CMOS; 190-2700 nm; Beam Size 0.5-45,000 µm; Power Range 100 µW - 8 kW; Interface USB, USB 2.0, Other
Duma Optronics offers a comprehensive series of beam analyzers based on technologies such as scanning knife-edge with tomographic beam reconstruction. The series’ wide spectral range is unprecedented for a single detector, ranging from 200 to 1600 nm and even further on to 2700 nm.
High-power beam analyzers are available for testing high-power laser beams used for material processing. These HP models allow online measuring of beam profile and absolute power, measurement of M² and accurate location of beam waist for laser printing technology.
Duma Optronics’ series of beam analyzers is capable of analyzing beam sizes from under 0.5 µm up to 45 mm and feature a full set of attachments for M² measurement and other sophisticated applications.
BeamOn 2 MP: Best cost-effective system for high-resolution laser beam measurement, especially for focused beams. Key Features are 2 Megapixel resolution, 3 µm per pixel and down to 60 µm beam size. Download datasheet
BeamOn WSR: This beam analyzer is based on a proprietary technology measuring from UV to 1550 nm with camera technology. For BeamOn WSR, a complete set of accessories is available, including a built-in motorized filter wheel. Download datasheet
BeamOn LA: A beam diagnostics measurement system for real-time measurement of continuous or pulsed large laser beams (up to 45 mm). Download datasheet
µBeam: The analyzer for microscopic beams: A beam diagnostics measurement system for real-time measurement and display of small CW or pulsed lasers in the sub-micron range, fiber optic and laser diode beam profiles. Download datasheet
BeamOn U3: This 2.35 Megapixel wide spectral range detector is capable of measuring beams up to 1600 nm with a full setup of accessories for various applications. Download datasheet
LAM Beam Analyzer: New instrument especially designed for LAM (Laser Additive Manufacturing). Measuring critical parameters such as beam size, accurate beam position and power. Download datasheet
Beam Analyzer HP: High-power measurements up to 5 kW based on beam sampler technology combined with pressurized air cooling will measure beam profile in real time and relative power fluctuation. Download datasheet
BeamOn U3 HP: A full-power measurement system based on a high-resolution camera combined with Duma Optronics’ our patented technology of sampling and cooling will measure up to IR wavelengths of 1.6 microns. Download datasheet
BeamOn HP: Simplified version of beam analysis when compared to BeamOn U3, offering an excellent price-performance ratio. Download datasheet
Microbeam HP: A unique microbeam analyzer for relatively small focused beams down to less than 5 µm with power levels exceeding 100 W. Download datasheet
Complete Line of Laser Beam Analyzing
Suitable for CW and/or Pulsed Lasers
Two Technologies: Tomographic Knife-edge and CCD/CMOS Imaging Systems
Wide Range of Beam Sizes: 0.5 to 45,000 µm
Broad Wavelength Ranges From UV to 2700 nm
High-power (HP) Models Available
Full Set of Attachments for M² Measurement and Other Sophisticated Applications
Applications: Analyzing CW and Pulsed Laser Beams, Providing Profiles, Beam Size, Beam Position and Real-time Power Measurements. Analyzing Beams With Sizes Ranging From Less Than 0.5 µm up to 45 mm; Analyzing Laser Beams With Power Levels From pW up to Several W, High Power Versions up to 8 kW; Special Versions for Solar Energy